Surface roughening effects on GaN metal-Semiconductor-Metal Photodetectors

TFIR > Department of Electrical Engineering > conference > Item 987654321/1682

Please use this identifier to cite or link to this item: http://163.15.40.127/ir/handle/987654321/1682

Title:	Surface roughening effects on GaN metal-Semiconductor-Metal Photodetectors
Authors:	Liu, K.T. Lin, W.H. Wu, Sean Hu, S.Y. Liu, F.R. 胡勝耀 (東方技術學院電機工程系)
Contributors:	東方技術學院電機工程系
Keywords:	GaN MSM PDs and surface roughening
Date:	2009-11-19
Issue Date:	2014-05-12 20:21:47 (UTC+8)
Publisher:	Kwieshan, Taoyan: Chang Gung University
Relation:	2009 international electron devices and materials symposia 2009年國際電子元件與材料研討會(IEDMS2009) 國際電子元件與材料研討會 IEDMS
Appears in Collections:	[Department of Electrical Engineering] conference

Files in This Item:

There are no files associated with this item.

View Licence